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Wafer appearance inspection equipment - メーカー・企業6社の製品一覧とランキング

更新日： 集計期間:Oct 15, 2025～Nov 11, 2025
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Wafer appearance inspection equipmentのメーカー・企業ランキング

更新日： 集計期間:Oct 15, 2025～Nov 11, 2025
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  1. null/null
  2. ヒューブレイン Osaka//Testing, Analysis and Measurement
  3. クボタ計装 Osaka//Testing, Analysis and Measurement
  4. 4 三谷商事 ビジュアルシステム部 Tokyo//software
  5. 5 オカノ電機 Tokyo//Electronic Components and Semiconductors
企業ランキングへ

Wafer appearance inspection equipmentの製品ランキング

更新日： 集計期間:Oct 15, 2025～Nov 11, 2025
※当サイトの各ページの閲覧回数を元に算出したランキングです。

  1. Wafer Appearance Inspection Device "ED-Scope"
  2. Wafer appearance inspection equipment *Functions can be selected according to the inspection content! ヒューブレイン
  3. Wafer appearance inspection equipment (automatic visual inspection equipment) クボタ計装
  4. 4 Wafer Appearance Inspection Device "Cosmo Finder" 三谷商事 ビジュアルシステム部
  5. 5 Wafer Appearance Inspection Equipment (Before Dicing) ヒューブレイン

Wafer appearance inspection equipmentの製品一覧

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Wafer Appearance Inspection Equipment (Before Dicing)

Wafer Appearance Inspection Equipment (Before Dicing)

Selectable image resolution tailored to inspection accuracy! Achieving fast and high-precision inspections.

The "Wafer Appearance Inspection Device (Before Dicing)" is a device capable of inspecting appearance defects that occur in the wafer process with high speed and high precision. Image resolution can be selected according to inspection accuracy (macro inspection with a resolution of approximately 10μm or higher). Additionally, the viewer software includes features such as inspection result map display, NG chip magnification display, and defect classification display (defect items/total inspections/OK/NG). 【Features】 ■ Multifunctional image inspection software Hu-Dra ■ Capable of inspecting appearance defects occurring in the wafer process ■ Auto-focus function (optional) ■ Marking error check function for all units (optional) ■ ID reading and mapping data output function (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Visual Inspection Equipment

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Wafer appearance inspection equipment *Functions can be selected according to the inspection content!

Wafer appearance inspection equipment *Functions can be selected according to the inspection content!

A wafer appearance inspection device capable of high-precision inspection with the selection of functions tailored to the inspection content and a wide range of optional features.

We would like to introduce our "Wafer Appearance Inspection System." This system can inspect appearance defects that occur during the wafer process at high speed and with high precision. The inspection targets include LSI, LD, Di, LED, power semiconductors, compound semiconductors, and MEMS. Examples of defects inspected include chipping, cracking, scratches, pattern anomalies, foreign objects, coating defects, and misalignment. 【Features】 ■ Functions can be selected according to inspection requirements - Micro inspection, macro inspection - Color inspection, monochrome inspection - Area camera, line camera - Surface inspection, front and back inspection ■ High-precision inspection is possible with a wide range of optional features *For more details, please download the PDF or feel free to contact us.

  • Visual Inspection Equipment

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Wafer appearance inspection device

Wafer appearance inspection device

It is an appearance inspection device for detecting defects such as scratches on the wafer.

By using software for recipe editing, you can freely create inspection processes, allowing you to perform efficient inspections tailored to your objectives.

  • Visual Inspection Equipment

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Wafer Appearance Inspection Device "Cosmo Finder"

Wafer Appearance Inspection Device "Cosmo Finder"

Achieving low-cost, space-saving, and high-speed appearance inspection! AI-equipped wafer appearance inspection equipment.

The "Cosmo Finder" is a device that achieves high-speed and high-precision appearance inspection of wafers using a microscope and image processing. With over 30 years of experience in image processing software development, we have incorporated many customer requests, enabling us to recognize various defects. It also demonstrates its effectiveness in detecting foreign objects and scratches that have been difficult to identify until now. Additionally, the main unit integrates an optical unit, a drive unit, an image processing unit, and a control unit, achieving high performance in a compact design. It can be utilized in various scenarios, from manufacturing processes to R&D departments. 【Features】 ■ Space-saving design ■ Over 30 years of experience in image analysis ensures high-precision inspection ■ AI-based classification technology supports problem-solving ■ Various optional features available *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Wafer Appearance Inspection System "OVS-5120 Series"

Wafer Appearance Inspection System "OVS-5120 Series"

Win the intensifying competition! Introducing high-performance machines at low cost.

The "OVS-5120 Series" is a wafer appearance inspection device that sets wafers supplied from the load port onto an XYθ stage and performs critical defect detection using a high-speed, high-resolution color area camera. It ensures that good products are not mixed with defective ones by utilizing special lighting and software for stable defect detection. Additionally, it is equipped with unique learning software that absorbs variations between lots. 【Features】 ■ Incredible detection capability ■ Reproducibility ■ Strong adaptability in the field ■ Easy recipes for anyone ■ Low-cost/high-performance machine *For more details, please refer to the PDF materials or feel free to contact us.

  • Visual Inspection Equipment

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Wafer appearance inspection equipment (automatic visual inspection equipment)

Wafer appearance inspection equipment (automatic visual inspection equipment)

Automating visual inspection of wafer defects.

■This is a device that responds to the following requests and concerns! - We want to automate visual inspection of defects on wafers (substrates). - We want to reduce and prevent variability in pass/fail judgments among inspectors. - We want to save inspection data and trace quality. - We want to automatically discriminate defects. ■Features of the device - It can automatically detect, extract, and discriminate visually identifiable defects. - We can propose an optical system optimized for the types of defects. - We can suggest both manual and automatic transport (cassette to cassette). - It also implements AI functions, allowing for improved defect discrimination accuracy through ongoing learning.

  • Semiconductor inspection/test equipment

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Wafer Appearance Inspection Device (Model MWL-02)

Wafer Appearance Inspection Device (Model MWL-02)

This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.

In macro inspection, the wafer angle can be freely adjusted using joystick operation. Additionally, in micro inspection through microscope observation, it is possible to switch between viewing through the eyepiece and the monitor. Two wafer cassettes can be mounted.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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